Williams' Pastor Maldonado was in the FW35-04 in the morning to perform tyre testing for Pirelli. After the lunch break, Daniel Juncadella returned to the car after... read more »

Daniel Ricciardo put his Toro Rosso top on day two of the young driver/tyre test with a 1:32.972 after completing 48 laps in the morning. The Australian then climbed into the... read more »

Daniel Juncadella to run on day two with Williams after Young Driver Test programme is expanded     read more »

Daniel Juncadella's Young Driver Test outing with Williams has been extended after the outfit suffered bodywork problems in the early stages of the opening day. read more »

Daniel Juncadella's young driver test outing with Williams at Silverstone has been extended into a second day because of restricted running this morning read more »

Daniel Juncadella debuted for Williams on the first day of testing at Silverstone. He completed 55 laps in the FW35-04 doing aero evaluations and tyre testing. read more »

McLaren's young driver Kevin Magnussen topped the times on the first day of the Silverstone test with a 1:33.602. The Danish driver put the MP4-28 top with a lap on the... read more »

Pat Symonds, the former Renault F1 engineering head who was banned from Formula One in 2009 after a Singapore Grand Prix crash scandal, has joined Williams as chief technical... read more »

Pat Symonds will join Williams as technical director in mid-August, replacing Mike Coughlan who will leave with immediate effect, the Grove outfit confirmed on Tuesday. The... read more »

Williams F1 have announced the appointment of Pat Symonds at Chief Technical Officer, replacing Mike Coughlan who leaves the team with immediate effect. Effective 19th August,... read more »

Williams have signed engineer Pat Symonds as chief technical officer following his five-year ban for race fixing. read more »

On a day of non-stop announcements, Pat Symonds is to replace Mike Coughlan at Williams, as Spy-gate gives way to Crash-gate. read more »

Williams have announced the appointment of Pat Symonds as Chief Technical Officer, with Mike Coughlan leaving the team. read more »

Williams have announced that Mike Coughlan has stepped down and will be replaced by Pat Symonds... read more »

Williams makes a personnel change at the very top of its engineering tree, with Pat Symonds replacing Mike Coughlan over the course of the next few... read more »

Pat Symonds will join Williams as its Chief Technical Officer next month. The former Renault chief, whose departure from Marussia was announced earlier on Tuesday, will step... read more »

Pat Symonds will join Williams next month in place of technical director Mike Coughlan, who has left the team with immediate effect. read more »

Marussia has parted ways with its technical consultant Pat Symonds after he reached an agreement with the team to leave with immediate effect read more »

Susie Wolff and Daniel Juncadella will join Williams regular Pastor Maldonado at the upcoming Silverstone Young Driver Test. Wolff, partner of Mercedes chairman Toto, has taken... read more »

The Williams F1 Team today confirmed that it will run its Development Driver Susie Wolff and rising star Daniel Juncadella at the Young Driver Test at Silverstone Circuit on... read more »

Having completed his maiden Formula 1 outing behind the wheel of a 2009-spec Ferrari last November, reigning European Formula 3 Champion Daniel Juncadella has labelled his... read more »

Williams development driver Susie Wolff says she is under no illusions about the challenges that lie ahead during her first official Formula 1 test at Silverstone, but has... read more »

Scot Susie Wolff is set for her first full Formula 1 test at the wheel of a Williams in this week's 'young-driver' test. read more »

Susie Wolff will get her first taste of Formula One action when she takes part in the Young Driver Test at Silverstone this week... read more »

Williams has confirmed that three drivers will share its FW35 at this week's Silverstone Young Driver test, including Pastor Maldonado.     read more »